Original title: Examination of Graphene with Very Slow Electrons
Authors: Mikmeková, Eliška ; Frank, Luděk
Document type: Papers
Conference/Event: NANOCON 2014. International Conference /6./, Brno (CZ), 2014-11-05 / 2014-11-07
Year: 2014
Language: eng
Abstract: Although graphene has been available and intensively studied for nearly a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning electron microscopy with slow and very slow electrons offers an innovative tool enabling one to see graphene samples at nanometer or even sub-nanometer lateral resolution in both transmitted and reflected electrons and to count the number of layers reliably in both imaging modes. Diagnostics can be performed in this way on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. Moreover, bombardment with very slow electrons acts as an ultimate cleaning procedure removing adsorbed gases from crystal surfaces which can be monitored in scanned transmission electron images taken at below 50 eV.
Keywords: graphene; slow electrons; ultralow energy STEM; very low energy scanning electron microscopy
Project no.: TE01020118 (CEP), LO1212 (CEP)
Funding provider: GA TA ČR, GA MŠk
Host item entry: NANOCON 2014. 6th International conference proceedings, ISBN 978-80-87294-55-0

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0241324

Permalink: http://www.nusl.cz/ntk/nusl-178288


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Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers