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Trendy v chladicí technice
Matoušek, Vít
The bachelor thesis is focused on trends in the field of compressor refrigeration technology. The principle of basic refrigeration circuits is explained here, including the description and functions of individual components of the compressor refrigeration circuit. Part of the work is also acquainted with the refrigerants used in the refrigeration circuit, including the legislative rules that govern it. The main part of the work deals with the latest and most used systems in modern refrigeration systems. A new generation of refrigerants is also described here, which is becoming an alternative to environmentally hazardous refrigerants.
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Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air
Matoušek, Vít
Laser interferometers are even more precise distance measurement devices with resolution in nanometer or sub-nanometer region. If interferometric measurements are carried out under atmospheric conditions (usual situation in industry), they measure optical path length of an unknown distance instead of its true geometrical value. It is caused by an index of refraction of air that introduces a multiplicative constant to measured results. If we want to obtain correct values, the knowledge of the index of refraction is necessary. Generally, the index of refraction can be measured by two ways: indirectly or directly. The first of them is based on parametric analysis of atmospheric properties as: relative humidity, pressure, temperature, concentration of CO.sub.2./sub. etc. Values of these parameters are processed then by Edlen formulas with 10.sup.-7./sup. order [1]. The direct methods are more precise then Edlen formulas (more than 10.sup.-7./sup.) but their practical implementation is more difficult. Devices that directly measure the index of refraction are called refractometers.
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Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air
Matoušek, Vít
Laser interferometers are even more precise distance measurement devices with resolution in nanometer or sub-nanometer region. If interferometric measurements are carried out under atmospheric conditions (usual situation in industry), they measure optical path length of an unknown distance instead of its true geometrical value. It is caused by an index of refraction of air that introduces a multiplicative constant to measured results. If we want to obtain correct values, the knowledge of the index of refraction is necessary. Generally, the index of refraction can be measured by two ways: indirectly or directly. The first of them is based on parametric analysis of atmospheric properties as: relative humidity, pressure, temperature, concentration of CO.sub.2./sub. etc. Values of these parameters are processed then by Edlén formulas with 10.sup.-7./sup. order [1]. The direct methods are more precise then Edlén formulas (more than 10.sup.-7./sup.) but their practical implementation is more difficult. Devices that directly measure the index of refraction are called refractometers.
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New method for direct measurement of refraction index of air with He-Ne lasers
Matoušek, Vít ; Číp, Ondřej
Interferometer methods are used for the high accuracy measurement of distance by specifying the measurement of the air index, since the measurement of the refraction index of air is in atmosphere, the refraction index of air is dependant upon temperature, pressure and humidity. For the measurement of the refraction index of air, Eden's formula is usually used. The formula depends upon the atmospheric values and the CO2 concentration.
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