National Repository of Grey Literature 116 records found  beginprevious81 - 90nextend  jump to record: Search took 0.00 seconds. 
SMV-2013-15: Relief structures based on diffractive optics
Horáček, Miroslav ; Kolařík, Vladimír ; Matějka, Milan ; Urbánek, Michal ; Krátký, Stanislav ; Chlumská, Jana ; Král, Stanislav
Research and development in the field of physical realization of graphic and optical structures based on the principle of diffractive optics by means of electron beam lithography in a recording material supported by a silicon or glass board. The research covers the analysis of the graphical or optical motive, research and application of relief structures implementing the required graphic and optical properties, research and modeling of the physical possibilities of implementation of relief structures, preparation and analysis of technology of implementation of relief structures with regard to the limits of current scientific instruments, verification of theoretical considerations by means of relief structure sample exposure.
SMV-2012-05: Relief structures based on diffractive optics
Horáček, Miroslav ; Kolařík, Vladimír ; Matějka, Milan ; Urbánek, Michal ; Krátký, Stanislav ; Chlumská, Jana ; Král, Stanislav
Research and development in the field of physical realization of graphic and optical structures based on the principle of diffractive optics by means of electron beam lithography in a recording material supported by a silicon or glass board. The research covers the analysis of the graphical or optical motive, research and application of relief structures implementing the required graphic and optical properties, research and modeling of the physical possibilities of implementation of relief structures, preparation and analysis of technology of implementation of relief structures with regard to the limits of current scientific instruments, verification of theoretical considerations by means of relief structure sample exposure.
Testing specimens for SEM
Kolařík, Vladimír ; Matějka, Milan ; Urbánek, Michal ; Krátký, Stanislav ; Chlumská, Jana ; Horáček, Miroslav ; Král, Stanislav
Research and development in the field of relief testing structures on Silicon wafer. The specimen is to be used for testing of metrics (dimensions and orthogonality) of scanning electron microscopes (SEM) as well as for the calibration of the SEM view of field. A set of samples is prepared on a Silicon wafer by means of electron-beam lithography and related techniques. The specimens are individually finalized. Related research and development in the field of accuracy assessment and control as well as tolerance measurements in the micron domain; Calibration Certificate.
SMV-2013-01: Relief structures based on diffractive optics
Horáček, Miroslav ; Kolařík, Vladimír ; Matějka, Milan ; Urbánek, Michal ; Krátký, Stanislav ; Chlumská, Jana ; Král, Stanislav
Research and development in the field of physical realization of graphic and optical structures based on the principle of diffractive optics by means of electron beam lithography in a recording material supported by a silicon or glass board. The research covers the analysis of the graphical or optical motive, research and application of relief structures implementing the required graphic and optical properties, research and modeling of the physical possibilities of implementation of relief structures, preparation and analysis of technology of implementation of relief structures with regard to the limits of current scientific instruments, verification of theoretical considerations by means of relief structure sample exposure.
Structural Color of Metallic Surfaces
Kolařík, Vladimír ; Horáček, Miroslav ; Urbánek, Michal ; Matějka, Milan ; Krátký, Stanislav ; Chlumská, Jana ; Bok, Jan
Nano structuring of metallic surfaces shows surface colors unusual for a given material. This study presents an overview of possible approaches to achieve desirable color changes. The nano structured relief structures prepared by means of electron beam lithography process are presented. Optical design and simulation of optical properties, data preparation for e-beam patterning, parameters of the writing process, and technological issues are presented in detail. Finally, real examples of structures that exhibit surface color changes are presented and discussed.
E-beam Nano-patterning for Electroforming Replication
Krátký, Stanislav ; Kolařík, Vladimír ; Urbánek, Michal ; Paták, Aleš ; Horáček, Miroslav ; Matějka, Milan
This contribution deals with nano-patterning by the way of electron beam lithography with satisfying requirements for electroforming replication of desired patterns. Electron beam lithography can be used for creating nano graphics (images, text etc.) due to its very high resolution and precision. However, patterns created by electron beam lithography cannot be applied for mass production directly because of resist material soft nature (usually a polymer material). Because of that, hard printing plate must be produced. Nickel plate prepared by electroforming is one of the ways to accomplish that. Prior to the production of nickel plate by electroforming, the surface of polymer material has to be covered by a sufficiently thick layer of metal. This procedure can lead to a partial destruction of the motif (completely covered by metal) thus the decreasing of nano graphics resolution. In this paper several nano graphics (images and text with various resolutions) are prepared in positive resist PMMA (thickness of 2000 nm) by e-beam lithography. Chemical developer (pentyl acetate) was used for wet developing of prepared patterns. The sputtering of silver (100 nm) was carried out to achieve sufficient thickness of conductive layer for electroforming. Electron scanning microscope was used for evaluation, which one of the images and texts are still recognizable.
Some Other Gratings: Benchmarks for Large-Area E-Beam Nanopatterning
Meluzín, Petr ; Horáček, Miroslav ; Urbánek, Michal ; Bok, Jan ; Krátký, Stanislav ; Matějka, Milan ; Chlumská, Jana ; Kolařík, Vladimír
E-beam lithography is a flexible technology for diffraction gratings origination. Nevertheless, requirements of the high optical quality of large area diffractive structures imply various severe challenges to e-beam delineating processes. This paper summarizes the e-beam process parameters that influence the quality of large area grating structures. Next, we propose some new methods to prepare diffraction gratings that were found to be useful for testing and benchmarking purposes. Those methods include single line gratings, labyrinth structures, fractional structures, tiling patterns, quasi regular filling structures and forked line structures. Various samples were prepared with the standard and newly developed e-beam patterning processes using both e-beam writers available: one with the Gaussian beam at 100 keV and another one with the shaped beam at 15 keV. Some of the results are presented further in this paper, their variants and parameters are discussed as well as their usefulness as benchmarking e-beam patterns for large area optical structures, elements and devices.
Exposure Time Comparison between E-beam Writer with Gaussian Beam and Variable Shaped Beam
Horáček, Miroslav ; Krátký, Stanislav ; Urbánek, Michal ; Kolařík, Vladimír ; Meluzín, Petr ; Matějka, Milan ; Chlumská, Jana
One of the main goals in e-beam lithography is to increase exposure speed to achieve higher throughput. There are basically two types of electron-beam writers, shaped beam lithography systems and Gaussian beam lithography systems. The exposure time of both e-beam writers consist in essence of beam-on time, deflection system stabilization time and stage movement time. Exposure time testing was carried out on two types of patterns. There were completely filled in areas, binary period gratings (ratio 1:1 between exposed and unexposed areas), and multileveled structures (computer generated holograms). Exposures data was prepared according to standard technology (PMMA resist, exposure dose, non-alcoholic based developer) for both systems. The result of experiment shows that variable shaped beam system has advantage in multileveled structures while the Gaussian beam system is more suitable for gratings type of pattern. It was proved that combination of both systems has its use to increase exposures throughput.
Plasmonic Structures In PMMA Resist
Urbánek, Michal ; Krátký, Stanislav ; Šimík, M. ; Kolařík, Vladimír ; Horáček, Miroslav ; Matějka, Milan
Some metal material can exhibit special physical phenomenon which is called plasmon resonance. This effect can be used in optical applications where designed structures, using this effect, have special function as optical filters, polarizers, holograms etc. This papers deals with preparation of plasmonic structures in poly(methyl methacrylate) (PMMA) resist which is the most common material used for e-beam processing. Designed structures were prepared by e-beam writer with Gaussian beam and accelerating voltage of 100 kV. These structures are usually prepared into negative tone resist hydrogen silsesquioxane (HSQ). We prepared these structures by unusual way into positive resist PMMA due to unavailability and cost of HSQ resist. By this way we are able to achieve high resolution of structures suitable for special optical application. Exposed structures were developed in isopropyl based developer. Final structures after development were coated by two metal layers (first one is Ag layer, second one is gold) by magnetron sputtering and vacuum evaporation. The quality of prepared plasmonic structures was examined by confocal laser scanning microscopy (CLSM) and scanning electron microscopy (SEM).
Phase photo masks produced by means of electron beam lithography and ion etching for Bragg gratings
Krátký, Stanislav ; Urbánek, Michal ; Kolařík, Vladimír ; Horáček, Miroslav ; Chlumská, Jana ; Matějka, Milan ; Šerý, Mojmír ; Mikel, Břetislav
Fiber Bragg grating is based on the local changes of refractive index in the core of the optical fiber. It has a wide application area, e.g. different types of filters in communications, and it may also be used in sensing of mechanical stresses. One can use different technologies to prepare this type of grating, e.g. the refractive index can be modified directly during production of an optical fiber. Further, the grating may be exposed point by point by a laser beam. The most effective way is an exposure through a phase mask, since a mask may be used for the production of hundreds of grids. This paper discusses different approaches for the preparation of phase masks in terms of impact on the quality of the exposed Bragg grating. The lattice phase mask is defined mainly by two parameters; period and depth.

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See also: similar author names
2 Kolařík, Vojtěch
1 Kolařík, Václav
2 Kolařík, Vít
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