National Repository of Grey Literature 103 records found  beginprevious86 - 95next  jump to record: Search took 0.00 seconds. 
Logistic process optimization in expedition of electrical enterprise
Reboková, Lenka ; Jirák, Josef (referee) ; Špinka, Jiří (advisor)
Logistics as a process of planning, realization and controlling of effective and powerful workflow and commodities warehousing, services and related information with the goal of costumers satisfaction, became highly important and inseparable part of every company. The essential part of the planning process is an analysis of the current company situation, which tries to find all the limiting factors, and which serves as a basis for the process of making a company more effective. This diploma thesis analyses the current state of the expedition division of the ModusLink Czech Republic s.r.o. company – it analyses all its working operations in detail and using chronometrical analysis method evaluates division‘s theoretical and feasible throughput capacity. The feasible throughput capacity is then confronted with division’s real throughput capacity achieved during the monitored months, and depending on the results of the comparison there are some conclusions and recommendations for future improvements mentioned.
Logistic process leadership optimization in big enterprise
Přichystal, Tomáš ; Zatloukal, Miroslav (referee) ; Špinka, Jiří (advisor)
The Master’s thesis deals with logistics and resources monitoring area, which is inseparable part of every production oriented economic activity. It uses electronic monitoring systems for more effective dealing with stock records in a production company that has many stores. The monitoring utilizes modern technologies, that are burgeoning and finding its use in all branches of market.
Nastavení vlhkosti v ESEM
Autrata, Rudolf ; Jirák, Josef ; Špinka, Jiří
Possibilities of humidity adjustment and measurement in the specimen chamber of the environmental scanning electron microscope (ESEM) at low pressure are described in this work. Optimal pumpdown sequence and filling-in of water vapors to the specimen chamber problems are solved simultaneously. Suggested cycle serves for obtaining of suitable environment in the vicinity of the examined specimen and can be exploited for observation of battery mass structures in the process of their utilization.
Detection of signal electrons at higher pressure in the specimen chamber
Jirák, Josef ; Autrata, Rudolf ; Špinka, Jiří
The advantages of the scanning electron microscopy working at higher pressures in the specimen chamber are connected with the possibility of observation of specimens structures, which are difficultly observable without previous preparation for microscopes working with pressures in the specimen chamber under 10.sup.-2./sup. Pa. The pressure in the specimen chamber up to approx. 2000 Pa brings the possibility of observation of specimens, which release gases, specimens containing liquid phase, including wet biological preparations, reactions on the phase interfaces, etc. At higher pressures in the specimen chamber it is also not necessary - due to neutralisation of the surface negative charge by gas ions - to coat electrically non-conductive specimens by a conductive layer.
X-ray microanalysis in ESEM and LV SEM
Autrata, Rudolf ; Jirák, Josef ; Špinka, Jiří
The scattering of primary electrons to so-called skirt, appearing in the range of pressures used in regimes of LV SEM (low vacuum) as well as in ESEM, has no substantial influence on the spatial resolution for commonly used types of imaging in the scanning electron microscope. It demonstrates itself just as a higher share of the noise signal. What is more, it brings known substantial advantages, as that no preparation of modification of non-conductive samples is needed and observation of liquid phase containing specimens is made possible.
Combined detector for BSE, SE and BSE+SE detection in a low voltage SEM
Autrata, Rudolf ; Jirák, Josef ; Romanovský, Vladimír ; Špinka, Jiří
Specimen observation at a low accelerating voltage of the electron beam (around 1kV) is a new and attractive technique of scanning electron microscopy. While detection to the signal of secondary electrons (SE) with the help of the scintillation-photomultiplier system described by Everhart-Thornley does not depend on the primary beam energy, the detection of backscattered electrons (BSE), having their energy only a bit lower than energy of the beam, is limited by a low sensitivity of semiconductor or channel plate detectors to channel plate detectors to electrons of energy below 2 keV.
Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures
Autrata, Rudolf ; Jirák, Josef ; Špinka, Jiří
The contribution is oriented to the area of scanning electron microscopy operated in the specimen chamber at higher pressures reaching hundreds to thousands of Pa. It deals with questions of signal detection and with the study of the effect of parameters of the incident primary electron beam on signal detection.

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