National Repository of Grey Literature 18 records found  1 - 10next  jump to record: Search took 0.00 seconds. 
Preparation and testing of SNOM probes
Bobek, Juraj ; Neuman, Jan (referee) ; Spousta, Jiří (advisor)
Photonic crystal fibers (PCF) represents a promising tool for connecting techniques known from scanning probe microscopy, electron microscopy and gas injection systems. To bring light and transfer working gas simultaneously to the vicinity of a sample located inside the electron microscope introduces new possibilities for experiments. PCF could be used not only to characterize or modify structures at microscopic level, but also to fabricate them. This work covers a literature research of photonic crystals with an emphasis on PCF. Etching in hydrofluoric acid of the PCF without damaging its inner structure is experimentally studied with great care. Optical properties dependent on the geometry of the PCF are tested for various modifications of the PCF. Furthermore, the thesis deals with the connection of the PCF with an atomic force microscope and subsequent integration into the electron microscope.
Preparation and testing of SNOM probes
Bobek, Juraj ; Pavera, Michal (referee) ; Spousta, Jiří (advisor)
The area of research that deals with surface modification and preparation of nanostructures is still very unexplored. And only a little contribution to this field is discussed in this bachelor thesis. Its goal is to manufacture and to test a probe made off hollow optical fibre that is used in Scanning Probe Microscopy. Optical fibre parameters in combination with proper and unique techniques allow the breakthrough off very interesting applications. It's worth mentioning the gas injection in the proximity of the surface of a sample (GIS) and thus its modification by use of electrons (FEBID), ions (FIBID) or laser beams.
Mathematics for Electromagnetism
Rára, Michael ; Spousta, Jiří (referee) ; Doupovec, Miroslav (advisor)
The goal of this thesis is the description of elektromagnetism by means of selected parts of mathematics, in particular tensors, vector fields, integral calculus and integral theorems. Maxwell's equations will be derived by means of these notions in integral form, differential form and tensor form, we also show usefulness of tensor form of these equations.
Preparation of SNOM probes with special properties
Hertl, Vít ; Kvapil, Michal (referee) ; Spousta, Jiří (advisor)
This bachelor thesis is focused on preparation and testing of probes from a hollow optical fibre and their application in SNOM measurement. Further, special properties of these probes are studied, namely their use as a "nanoGIS". The main problems as etching from the inside are assumed to be solved.
Application of Interferometry in VT UHV SPM
Šulc, Dalibor ; Klapetek, Petr (referee) ; Fejfar, Antonín (referee) ; Spousta, Jiří (advisor)
The thesis is aimed at the development of Scanning Probe Microscopes (SPM). It describes design and development of modular controll electronics to be applied eectively on more microscopes SPM. Control electronics consist of stabilized power source, high–voltage amplier and probe signal amplier. The open–source project GXSM has been introduced. It contains a logic control unit which controls scanning, acquiring data and feedback control. GXSM provides a graphical user interface based on linux operation system. Second part of the thesis is aimed at design and development of interferometric deection sensing system for SPM cantilevers and applications at SPM in general. Designed interferometer has been assembled and tested. It can clearly distinguish a signal of amplitude 2 nm. At the end of the thesis the design of interferometric system implementation is presented.
Microdefects in Czochralski Silicon
Válek, Lukáš ; Fejfar, Antonín (referee) ; Mikulík, Petr (referee) ; Spousta, Jiří (advisor)
Disertační práce se zabývá studiem defektů v monokrystalech Czochralskiho křemíku legovaných bórem. Práce studuje vznik kruhových obrazců vrstevných chyb pozorovaných na povrchu křemíkových desek po oxidaci. Hlavním cílem práce je objasnit mechanismy vzniku pozorovaného rozložení vrstevných chyb na studovaných deskách a vyvinout metody pro řízení tohoto jevu. Na základě experimentálních analýz a rozborů obecných mechanismů vzniku defektů jsou objasňovány vazby mezi vznikem defektů různého typu. Tyto jsou pak diskutovány v souvislosti s parametry krystalu i procesu jeho růstu. Takto sestavený model je využit pro vývoj procesu růstu krystalů, kterým je potlačen nadměrný vznik defektů ve studovaných deskách. Za účelem studia defektů jsou zaváděny a vyvíjeny nové analytické metody. Disertační práce byla vytvořena za podpory ON Semiconductor Czech Republic, Rožnov pod Radhoštěm.
THE APPLICATION OF NANOMATERIALS FOR LEAD FREE SOLDERS DEVELOPMENT
Pešina, Zbyněk ; Pinkas, Jiří (referee) ; Spousta, Jiří (referee) ; Sopoušek, Jiří (advisor)
The present dissertation is motivated by the search for alternatives of lead-free soldering by nanoparticles of metals and their alloys. The research focuses on the possibility of replacing lead-free solders by nanoparticles. This issue is currently being addressed by the use of lead-free solders but their properties are not entirely equivalent to properties of lead-tin based alloys. The theoretical part of the dissertation first summarizes up-to date knowledge on the development of lead-free alloys currently used for soldering in the electronics. The work compares these lead-free solder candidates with previously used Pb-Sn alloys. The second section of the theoretical part is devoted to nanotechnology that offers possible solutions of problems associated with the use of lead-free solders. The text contains a description of the properties of nanocrystalline materials in comparison with those of compact alloys having the same chemical composition. The possibility of preparation of nanoparticles and potential problems associated with small particle sizes are also presented. Introduction of the experimental part focuses on the preparation of nanoparticles of pure metals and alloys by chemical and physical ways as well as on an instrumentation for characterisation and analysis. Attention is focused on the silver in nanoparticle form that exhibits the low temperature sintering effect, which is thermally activated by decomposition of oxide envelope covering the Ag nanoparticles. This factor is critical for low-temperature sintering and thus also for possible future applications. The thermal effects of the low sintering process were studied by methods of thermal analysis. The preparation of the Cu / Ag nano / Cu joints was carried out in-situ in inert atmosphere and under the action of atmospheric oxygen. In both cases varying conditions of thermal treatment were used. The cross sections of the prepared joints were then used for the metallographic analysis of the local mechanical properties of the resulting silver layer, for the chemical composition evaluation of the resulting layers of the joint, and for the microstructure study. Strength characteristics are represented by testing shear strength of individual joints.
Thin Films of Polycrystalline Silicon
Lysáček, David ; Schmidt, Eduard (referee) ; Fejfar, Antonín (referee) ; Spousta, Jiří (advisor)
The doctoral thesis deals with the structure and properties of the polycrystalline silicon layers deposited on the silicon wafers backside. The wafers are further used for production of semiconductor devices. This work is focused on detailed description of the layers structure and study of the gettering properties and residual stress of the layers. The main goal of this work is to develop two novel technologies. The first one leads to improvement of the temperature stability of the gettering properties of the layers, and the second one solves the deposition of the layers with pre-determined residual stress. This doctoral thesis was created with the support of the company ON Semiconductor Czech Republic, Rožnov pod Radhoštěm.
Imaging Reflectometry Measuring Thin Films Optical Properties
Běhounek, Tomáš ; Spousta, Jiří (referee) ; Zicha,, Josef (referee) ; Kotačka, Libor (referee) ; Druckmüller, Miloslav (advisor)
V této práci je prezentována inovativní metoda zvaná \textit{Zobrazovací Reflektometrie}, která je založena na principu spektroskopické reflektometrie a je určena pro vyhodnocování optických vlastností tenkých vrstev .\ Spektrum odrazivosti je získáno z map intenzit zaznamenaných CCD kamerou. Každý záznam odpovídá předem nastavené vlnové délce a spektrum odrazivosti může být určeno ve zvoleném bodu nebo ve vybrané oblasti.\ Teoretický model odrazivosti se fituje na naměřená data pomocí Levenberg~-~Marquardtova algoritmu, jehož výsledky jsou optické vlastnosti vrstvy, jejich přesnost, a určení spolehlivosti dosažených výsledků pomocí analýzy citlivosti změn počátečních nastavení optimalizačního algoritmu.
Improvement of IBAD apparatus
Urbánek, Ivan ; Nebojsa, Alois (referee) ; Spousta, Jiří (advisor)
This thesis is divided into three main parts dealing with ion beam assisted deposition. In the first part there is a brief description of the IBAD chamber at Institute of Physical Engineering of BUT. There is also a detailed description of control of the IBAD apparatus during deposition. Next part deals with measuring of deposition rates of ion sputtering in order to refine deposition of thin layers. Last part deals with planned and already finished changes that should improve quality and speed of thin layers deposition. Changes include the option of covering the substrate holder, change of the entry flange, design of new insertion chamber with multifunctional substrate holder and the option to control the deposition by computer.

National Repository of Grey Literature : 18 records found   1 - 10next  jump to record:
See also: similar author names
1 Spousta, Jakub
2 Spousta, Jan
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