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Národní úložiště šedé literatury Nalezeno 2 záznamů.  Hledání trvalo 0.01 vteřin. 
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
 Rodenburg, C. ; Masters, R. ; Abrams, K. ; Dapor, M. ; Krátký, Stanislav ; Mika, Filip
A link between peaks in secondary electron (SE) spectra and Electron Energy Loss Spectra\n(EELS) was shown decades ago. Also, materials properties (bulk modulus, band gap)\ncorrelate with the bulk plasmon position in EELS, and local modulus maps in carbon fibres\nhave been presented. If any features as result of plasmon decay into SE can be identified,\nSE spectroscopy combined with hyperspectral imaging could transform the SEM into a tool\nfor mapping materials properties with ground-breaking potential for nanotechnology. To\nbecome a reality, we first need to establish SE collection conditions spectra that represent a\nmaterial reliably. Second, we need to gain a better understanding of the processes involved in the SE emission processes.
Úplný záznam
Secondary electron spectroscopy and energy selective imaging for the engineering of carbon based materials
 Rodenburg, C. ; Masters, R. ; Lidzey, D. ; Unčovský, M. ; Vystavěl, Tomáš ; Mika, Filip
That the fine structure of secondary electron emission spectra (SES) from carbon fibres is effected by fibre crystallinity and molecular orientation and linked to engineering materials properties such as modulus was reported over three decades ago. In spite of this\nlongstanding knowledge SES are not yet widely exploited for materials engineering of carbon based materials, probably due to a lack of instrumentation that is suitable to collect SES from beam sensitive materials and also has the capability to visualise, local variation based on SES shape. Thanks to rapid advances in low voltage SEM that offer energy selective imaging, it was recently demonstrated that differences in SES for different carbon based materials can be used to map chemical variations with sub-nanometer resolution when only SE 8 < eV were\nselected to form the SEM images. Such high resolution is not surprising as the implementation of energy filtering in SEMs to improve image resolutions was previously advocated. To fully exploit energy selective imaging for materials engineering the nature of the features in the SES must be determined.
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