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Determination of Roughness Factor and Fractal Dimension of Zirconium in its Native and Surface Modified State using Atomic Force Microscopy. Effect of the Hydrogen Evolution Reaction on the Surface Structure
Novák, M. ; Kocábová, Jana ; Kolivoška, Viliam ; Pospíšil, Lubomír ; Macák, J. ; Cichoň, Stanislav ; Cháb, Vladimír ; Hromadová, Magdaléna
Atomic force microscopy (AFM) was used to characterize surface morphology of pristine zirconium, Si modified and FeSi modified zirconium electrodes prior and after hydrogen evolution at potentials negative of the open circuit potential value. Two main characteristic parameters were obtained from the ex situ AFM height images, namely, the roughness factor and fractal dimension of the studied surface. The effect of hydrogen evolution reaction on the electrode surface morphology was discussed. Fractal dimension values were used successfully to explain the non ideality of the interfacial capacitance.

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