Original title: Silicon Solar Cell Parameters Change After Focused Ion Beam Milling
Authors: Gajdos, Adam
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: Silicon is still one of the most used materials for fabrication of solar cells. Some imperfections and defects may appear during production process. These local imperfections could be eliminated by focused ion beam (FIB). Nevertheless, FIB milling process modifies the crystal structure of the material by ions implantation. Samples under investigation are monocrystalline silicon solar cells. The impact of FIB milling is shown and discussed through current-voltage measurement before and after milling process.
Keywords: focused ion beam; I-V curve; SEM; Silicon; solar cell
Host item entry: Proceedings of the 23st Conference STUDENT EEICT 2017, ISBN 978-80-214-5496-5

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/187186

Permalink: http://www.nusl.cz/ntk/nusl-414846


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Conference materials > Papers
 Record created 2020-07-11, last modified 2021-08-22


No fulltext
  • Export as DC, NUŠL, RIS
  • Share