Original title:
Silicon Solar Cell Parameters Change After Focused Ion Beam Milling
Authors:
Gajdos, Adam Document type: Papers
Language:
eng Publisher:
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií Abstract:
Silicon is still one of the most used materials for fabrication of solar cells. Some imperfections and defects may appear during production process. These local imperfections could be eliminated by focused ion beam (FIB). Nevertheless, FIB milling process modifies the crystal structure of the material by ions implantation. Samples under investigation are monocrystalline silicon solar cells. The impact of FIB milling is shown and discussed through current-voltage measurement before and after milling process.
Keywords:
focused ion beam; I-V curve; SEM; Silicon; solar cell Host item entry: Proceedings of the 23st Conference STUDENT EEICT 2017, ISBN 978-80-214-5496-5
Institution: Brno University of Technology
(web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library. Original record: http://hdl.handle.net/11012/187186