Original title: Aplikace korelativní AFM/SEM mikroskopie
Translated title: Application of correlative AFM/SEM microscopy
Authors: Hegrová, Veronika ; Fejfar, Antonín (referee) ; Konečný, Martin (advisor)
Document type: Master’s theses
Year: 2019
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta strojního inženýrství
Abstract: [cze] [eng]

Keywords: AFM; Correlative AFM/SEM Microscopy; dry transfer; EBL; EDX; FIB; graphene; LiteScope; nanowire; SEM; thin films; WSe2; AFM; EBL; EDX; FIB; grafen; korelativní AFM/SEM mikroskopie; LiteScope; nanodrát; SEM; suchý transfer; tenké vrstvy; WSe2

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/179135

Permalink: http://www.nusl.cz/ntk/nusl-402580


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Master’s theses
 Record created 2019-08-26, last modified 2022-09-04


No fulltext
  • Export as DC, NUŠL, RIS
  • Share