Original title: Kalibrace metody SIMS pomocí implantačních profilů
Translated title: Calibration of SIMS method by implantation profiles
Authors: Janák, Marcel ; Průša, Stanislav (referee) ; Bábor, Petr (advisor)
Document type: Bachelor's theses
Year: 2019
Language: slo
Publisher: Vysoké učení technické v Brně. Fakulta strojního inženýrství
Abstract: [slo] [eng]

Keywords: AlGaN HEMT; cesium sputtering; dopant; III Nitrides; ion implantation; matrix effect; MOCVD; oxygen sputtering; preferential sputtering; Quantitative analysis; RSF method; TOF.SIMS 5; TRIM

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/179359

Permalink: http://www.nusl.cz/ntk/nusl-400083


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Bachelor's theses
 Record created 2019-08-26, last modified 2022-09-04


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