Název:
Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer
Autoři:
Zouhar, Martin ; Radlička, Tomáš ; Oral, Martin ; Konvalina, Ivo Typ dokumentu: Příspěvky z konference Konference/Akce: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr (CZ), 20180604
Rok:
2018
Jazyk:
eng
Abstrakt: The inelastic mean free path (IMFP) is a key parameter of electron transport in a solid. With\nthe rise of so-called meta-materials, materials of specific shape, such as 2D crystals, or\nmaterials with tailored functionality for next-generation electronic devices, the investigation\nof the IMFP is still topical and of high importance. This is true especially at low energies, landing energy of electrons below 100 eV, that are hard to study using well established\ntechniques of electron spectroscopy.
Klíčová slova:
electron microscopy; inelastic mean free path; low energy; time of flight Číslo projektu: TE01020118 (CEP) Poskytovatel projektu: GA TA ČR Zdrojový dokument: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar, ISBN 978-80-87441-23-7
Instituce: Ústav přístrojové techniky AV ČR
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Informace o dostupnosti dokumentu:
Dokument je dostupný v příslušném ústavu Akademie věd ČR. Původní záznam: http://hdl.handle.net/11104/0287642