Název:
Microstructural Defects of Solar Cells Investigated by a Variety Diagnostics Methods
Autoři:
Škvarenina, L’ubomír Typ dokumentu: Příspěvky z konference
Jazyk:
eng
Nakladatel: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstrakt:
This paper discusses the application of a variety diagnostic methods applicable to the solar cells. More objective results about solar cells quality and reliability are possible to obtain by using a various methods. Diagnostic methods described in this paper are based on a dark and illuminated J–V characteristics, a investigation of noise in a wide range of frequency and a radiation detection at a di erent spectral range, namely by an electroluminescence and a thermography method. These methods are primarily more appropriate for a detection or a localization of microstructure defects when a reverse-bias stress is applied. However, the analysis of a forward-bias conditions is included in an investigation of J–V characteristics as well.
Klíčová slova:
Defects; Electroluminescence; J–V curve; Noise; Solar Cells; Thermal Imaging Zdrojový dokument: Proceedings of the 22nd Conference STUDENT EEICT 2016, ISBN 978-80-214-5350-0
Instituce: Vysoké učení technické v Brně
(web)
Informace o dostupnosti dokumentu:
Plný text je dostupný v Digitální knihovně VUT. Původní záznam: http://hdl.handle.net/11012/84031