Název: Scanning thermal microscopy of thermoelectric pulsed laser deposited nanostructures
Autoři: Vaniš, Jan ; Zelinka, Jiří ; Zeipl, Radek ; Jelínek, Miroslav ; Kocourek, Tomáš ; Remsa, Jan ; Navrátil, Jiří
Typ dokumentu: Příspěvky z konference
Konference/Akce: NANOCON 2015. International Conference /7./, Brno (CZ), 20151014
Rok: 2015
Jazyk: eng
Abstrakt: New materials with high possible figure of merit ZT are of high interest as a promising candidates for thermoelectric applications such as energy harvesting. Miniaturization of such systems tends toward developing of the suitable characterization method with nanometer resolution ability. In our contribution, we present the development and experimental results of a simple scanning probe microscopy method for the relative thermal conductivity characterization. The possibility of the setup is demonstrated on the set of different thin thermoelectric layers grown from hot pressed targets by pulsed laser deposition on the reference Si substrate. All the measurements were performed on the commercial Veeco Multimode scanning AFM/STM microscope with home developed controller and by using PicoCal Inc. bolometer probes with tungsten resistive path. All the experiments were done in the air at the ambient condition. Additional sample treatment for the measurement will be also briefly described
Klíčová slova: figure of merit; Scanning thermal microscopy; thermoeletric materials
Zdrojový dokument: NANOCON 2015: 7th International Conference on Nanomaterials - Research and Application, Conference Proceedings, ISBN 978-80-87294-63-5

Instituce: Fyzikální ústav AV ČR (web)
Informace o dostupnosti dokumentu: Dokument je dostupný v příslušném ústavu Akademie věd ČR.
Původní záznam: http://hdl.handle.net/11104/0269816

Trvalý odkaz NUŠL: http://www.nusl.cz/ntk/nusl-263541


Záznam je zařazen do těchto sbírek:
Věda a výzkum > AV ČR > Fyzikální ústav
Konferenční materiály > Příspěvky z konference