Original title: Vliv pracovních podmínek v rastrovacím elektronovém mikroskopu Vega 3 XMU na signál detekovaný BSE detektorem
Translated title: Influence of working conditions on the detected signal by BSE detector in the scanning electron microscope Vega 3 XMU
Authors: Tkáčová, Tereza ; Chladil, Ladislav (referee) ; Čudek, Pavel (advisor)
Document type: Bachelor's theses
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Abstract: [cze] [eng]

Keywords: backscattered electrons; electron microscope; environmental scanning electron microscope; scintillation detector od backscattered electrons; signal to noise ratio; environmentálny rastrovací elektrónový mikroskop; pomer signál-šum; Rastrovací elektrónový mikroskop; scinilačný detektor spätne odrazených elektrónov; spätne odrazené elektróny

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/61687

Permalink: http://www.nusl.cz/ntk/nusl-255226


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Bachelor's theses
 Record created 2016-09-20, last modified 2022-03-03


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