Original title:
Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples
Authors:
Pokorná, Zuzana ; Knápek, Alexandr Document type: Papers Conference/Event: International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr (CZ), 20160529
Year:
2016
Language:
eng Abstract:
We explored the possibility of a Scanning Electron Microscopy technique for the determination of crystallographic orientation, based on the measurement of the reflectivity of very low energy electrons. Our experiments are based on the concept that in the incident electron energy range 0–30 eV, electron reflectivity can be correlated with the electronic structure of the material, which varies with the local crystallographic orientation of the specimen.\nThe motivation for the development of this technique was to achieve a quick and highresolution means for determining the crystallographic orientation of very small grains in a polycrystalline material. The key limiting factor was the cleanliness of the sample surface and also the geometrical setup of the experiment.
Keywords:
crystallographic orientation; electron microscopy; SEM Host item entry: Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 978-80-87441-17-6 Note: Související webová stránka: http://www.trends.isibrno.cz/
Institution: Institute of Scientific Instruments AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0260341