Original title: Zpětné zotavení ve výkonových integrovaných obvodech
Translated title: Reverse recovery in power integrated circuits
Authors: Šuľan, Dušan ; Žák, Jaromír (referee) ; Boušek, Jaroslav (advisor)
Document type: Master’s theses
Year: 2016
Language: eng
Publisher: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Abstract: [eng] [cze]

Keywords: dioda; doba života minoritních nosičů; LDMOS.; Reverse Recovery Time; TCAD; diode; LDMOS.; minority carrier lifetime; Reverse Recovery Time; TCAD

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/59904

Permalink: http://www.nusl.cz/ntk/nusl-242128


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Master’s theses
 Record created 2016-06-03, last modified 2022-03-03


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